Ion beam sputter coating - deposition of thin layers to the specimen surface, in particular, conductive coating for observation of a non-conductive specimen in an SEM.Surface milling and polishing, cross-section polishing as well as carbon or metal sputter coating are now possible within one instrument, using specialized functional holders.Newly designed multi-purpose stage to fulfill increasingly diversified market needs and allow multi-functionality by utilizing a variety of specimen holders. As landscape architects, we have the ability to propose solutions as well as an opening to apply the definition of beauty.Popular features such as intermittent milling (automated duty cycle for beam sensitive specimens) and fine milling (low voltage fine finish of specimen surfaces, ideally suited for techniques such as EBSD) are included in a standard configuration.Easy to set up and program for high-speed processing and finishing of high-quality cross sections in a short period of time.High-speed milling option – choose ion beam accelerating voltage of up to 10kV with up to 1.2 mm/hr milling rate.Mills large samples with wide area preparation (up to 8 mm wide cross-sections).Broad ion beam polishing using the JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts. Traditional mechanical preparation of specimen surfaces for SEM imaging can introduce various artifacts, such as scratches and embedded polishing media, that obscure the original microstructure, crystallographic information and precise layer thickness measurements. This new configuration includes high-speed milling, sputter coating, cryo-preparation (down to LN2 temperature) and air-isolated transfer for atmosphere sensitive specimens (for example Li batteries). It produces pristine cross sections of samples – hard, soft, or composites – without smearing, crumbling, distorting, or contaminating them in any way. The JEOL Ion Beam Cross Section Polisher (CP) is widely used for preparing pristine samples prior to high resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM). Only one of Global Solution, Regional Solution and Local Solution can be checked and these three fields cannot be used when a value is entered for the Reference Solution. ![]() In this technique, the cross sections of several materials are transformed into an equivalent cross section of one material on which the resisting forces and the neutral axis are the same as on the original section. Solution Area Section: The three checkboxes and the Reference Solution field act like a radio button. Nearly 2000 shipped – Best-selling solution for pristine sample preparation SEM Sample Preparation Chapters The purposes of the text are: To introduce the engineer to the very important discipline in applied mathematics-tensor methods as well as to show the fundamental unity of the different fields in continuum mechanics-with the unifying material formed by the matrix-tensor theory and to present to the engineer modern engineering problems. To analyze composite beams, we will use the common transformed-section method.
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